JULY 2005 PRODUCT NEWS

• Electro Standards Laboratories' new Model 4215 intelligent microprocessor based Smart Indicator has been designed for the measurement and control of strain gage transducer based systems. The new Model 4215 can be used with tensile testers, load cells, extensometers, torque transducers, pressure sensors and position encoders.
• NIST's Boulder Campus will offer a Short Course in Laser Measurements August 9-12, 2005. The three-and-one-half-day course will emphasize the concepts, techniques, and apparatus used in measuring laser parameters and will include a visit to NIST laser measurement laboratories.
• New Metrology Wells from Fluke’s Hart Scientific division extend cal laboratory performance to the field - offering stability to ±0.005 °C and axial (vertical) uniformity to ±0.02 °C.
• The Control Charting for Metrology Applications seminar formalizes the various indirect ways that control charts are used in the metrology setting. When a metrologist checks their standards at a regular interval, performs intermediate checks and record the data, they are informally performing the first half function of control charts.
• NAPT's upcoming ILC/PTs are being held at Duke Power later this month. NAPT has more Regional events scheduled and is developing new inter-laboratory comparison/proficiency tests.

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