CD-ROM From IDW 2005 Conference

IDW 2005 was the premier conference event of leading edge dimensional measurement. Held at the Opryland Resort & Convention Center May 9-13, IDW 2005 had more than 20 presentations and workshops focused on topics that included laser technology, multisensor coordinate measuring machines (CMMs), surface analysis, thread gaging and more.

Keynote speaker Richard Kayser, Acting Deputy Director of NIST, provided attendees with an in-depth look at the new NIST facilities. This CD-ROM contains all these talks and more. Full documents and PowerPoint presentations are included.

Contents off the CD-Rom can be found by clicking here. Purchase this CD-ROM from Quality Magazine's secure shopping center.
Cost: $49.95 plus $5 s/h.

Visit this page to learn more: http://www.qualitymag.com/FILES/HTML/QTY_market_research_index/0,6930,,00.html

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