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NOVEMBER 2006 INDUSTRY NEWS

 

Assessment of Minimally Staffed Test and Calibration Laboratories

ISO IEC Standard 17025 is applicable to all laboratories regardless of the number of personnel which means that even minimally staffed laboratories (MSLs) may seek accreditation. MSLs find that certain requirements of the standard, such as appointment of deputies to key management personnel, internal auditing and providing adequate supervision of staff, etc., difficult to address.

To learn more about the difficulties and challenges faced by MSLs please read read IAS (International Accreditation Service, Inc.) Staff Metrologist B.N. Taranath's full paper at: http://www.iasonline.org/More/MSL_newsletter.pdf.

 

Decimals Score a Point on International Standards

We’re in the end game. It soon may be possible to write international standards documents with decimal points in them. The issue is more than academic—it can affect sales of U.S. exports. The breakthrough comes as a result of dogged determination on the part of the National Institute of Standards and Technology (NIST) and ANSI, the official U.S. representative body in major international standards organizations.

Until recently, the rule at the International Organization for Standardization (ISO—the world's largest developer of standards) and the International Electrotechnical Commission (IEC—the leading global electrical and electronic standards organization) was that all numbers with a decimal part must be written in formal documents with a comma decimal separator, the prevailing fashion in Europe. The constant pi, for example, starts 3,141 592 653.

This had been something of an irritant for the English-speaking world (plus such notable countries as China, India and Japan) where the decimal point is used. Moreover, it could be expensive. Countries that adopted labeling or import documentation regulations based on ISO or IEC standards could block imports from the U.S. on the strength of decimal points in their specifications.

That sort of change doesn't happen overnight. The first step was to secure a resolution by the General Conference on Weights and Measures (CGPM—the reigning international treaty organization dealing with measurement) endorsing the use of the point on the line as a decimal sign. That was in 2003. Then NIST, working through ANSI, went to work to get revisions to the formal ISO and IEC documentation standards and procedures eliminating language that forbade the use of the decimal point. In June, ISO agree to make such revisions subject to IEC agreement and an effective implementation plan. In September, IEC agreed with ISO.

The last remaining hurdle is to develop the implementation plan that makes sure that ISO and IEC staff change their publication style policies to reflect the now-legitimate use of decimal points in English-language documents. For more information visit http://www.nist.gov/public_affairs/techbeat/tb2006_1122.htm#decima.

 

IET Labs, Inc. is pleased to announce that they have successfully renewed and expanded their ISO/IEC 17025 accreditation through A2LA.

The scope of their A2LA accreditation now includes, amongst other capabilities, ac Resistance. IET Labs scope: http://www.a2la.org/scopepdf/2073-01.pdf

This expansion will allow them to be the first laboratory to offer accredited calibrations on many RLC Bridges including GenRad/QuadTech Digibridges and calibration kits.

“This is an important extension of our calibration capabilities for the metrology community,” stated Engineering Manager, Dr. David Sheena,. “For decades, engineers and technicians have found the GenRad Digibridge indispensable making them the world standard in RLC bridges. This extension will allow the Digibridge line and many RLC meters to maintain use in 17025 Accredited Laboratories for years to come.”

For more information, call 516-334-5959 or email sales@ietlabs.com.

 

RM 8820 SEM Magnification Calibration Reference Material Delivered

100 Scanning Electron Microscopy (SEM) Magnification Calibration Reference Materials (RM 8820) have been delivered to NIST's Technology Services. This RM is a 20 mm by 20 mm Si chip artifact designed to be used with scanning electron, scanning probe and optical microscopes in a wide scale of magnifications ranging from 1 times to 100 000 times. It was produced by deep-UV (ultraviolet) lithography with a very large set of features, which allow for many types of measurements, including X and Y scale calibration, various distortion measurements, and distance (pitch) measurements in the range of 10 mm to 100 nm. This sample is a successor to the popular RM 8020, which sold out very quickly. NIST now has the capacity to replenish the supply if it gets low again.

For more information contact Andras E. Vladar, (301) 975-2399 or visit http://www.mel.nist.gov/wnew/hilights/2006/hloct06.htm.

 

DHI Celebrates One of It’s Shining Stars

The management and staff of DHI (DH Instruments, Inc.) gathered together to celebrate the 25th anniversary of one of their colleagues, Karl Kurtz. The celebration included refreshments, toasts, and speeches by Martin Girard, President of DHI and the honoree, Karl Kurtz.

Both speakers reflected on the many years spent working together and also reminisced about the company’s early start-up years in Pittsburgh, PA. Martin told the DHI staff that he attributes Karl’s success at DHI to his work ethic. This guy really works! He is a guy you can count on. He’s practical and his can-do attitude has taken him a long way. He added that Karl has just completed a school that showcases another of his skills. He’s a captivating speaker and great at explaining things. Martin said, “Karl’s become a rock star on the metrology circuit.”

Martin noted that Karl is the third member of the 25-year club and added that there would be two more DHI employees joining this group in the next couple of years.

With the arrival of his 25th anniversary Karl asked himself why it was he had stayed at DHI so long, adding that it is really unusual accomplishment these days. He told the group that fundamentally it’s because DHI is a really good company at all levels, but that it is much more than that. He cited management as a key factor. Karl said, “Martin has done a really good job in keeping the company focused and profitable for a very long time and for those who have been around for a while, it is reassuring.”

He said, “There is something else that makes you want to come back to the same place year after year.” And so, why is it that DHI has so many lifers? Karl says emphatically, “It’s the people. I enjoy being with the people I work with and a part of the DHI team.”

DH Instruments, Inc. is a leading pressure and flow calibration instrument manufacturer and service provider. DHI is a growing small company with a track record, successful new products, international presence and a commitment to excellence. To learn more about DH Instruments visit http://www.dhinstruments.com/prof1/index.htm.

 

The Commerce Department Cordially Invites All Stakeholders to Attend a Public Forum on the European Unions Metric Directive

Beginning January 1, 2010, the European Union Council Directive 80/181/EEC (Metric Directive) will allow the use of only metric units, and prohibit the use of any other measurements for most products sold in the European Union (EU). The Metric Directive will make the sole use of metric units obligatory in all aspects of life in the European Union, extending to areas such as product literature and advertising.

Additional Information concerning the forum can be accessed using this link.

 

2006 Max J. Unis Award Winner

Congratulations to Phil Painchaud for being selected as the 2006 Max J. Unis Award winner. He will be receiving the much deserved award during MSC 2007.

Max J. Unis was the first chairman and a founder of the Metrology Technical Committee of the American Society for Quality Control (ASQC), which became the American Society for Quality (ASQ) Measurement Quality Division (MQD) in 1991. Max, a former director of the National Conference of Standards Laboratories (NCSL), was the founder of Gage Lab Corporation of Hutchington Valley, PA, and served as its Chairman of the Board until his death in July 1990. Max was a Mechanical Engineer specializing in Dimensional Metrology, and was considered a pioneer in the field of Metrology. Max participated on the ASQC-sponsored trip to the People’s Republic of China during the Nixon administration, to promote Metrological advancement and cooperation between the U.S. and China. Max was elected a Fellow of ASQC in May 1975.

When Gage Lab built their new facility, Max had an area within the building set up as a classroom for teaching Metrology-related subjects. At his passing, a request was made that donations in lieu of flowers be made to Drexel University Mechanical Engineering Department for the purchase of Metrology equipment.

The Max J. Unis award is the highest honor bestowed by ASQ’s Measurement Quality Division (MQD), to recognize outstanding contributions to the Metrological community.
http://www.asq.org/measure/about/about_award.html


CCT Update

The latest updates from Chris Grachanen, MQD Certification Chair. CCT alumni continue to grow with each offering of the CCT exam. Congratulations to the new June 2006 alumni!

Date of Exam  
 Sat for Exam
Passed Exam
% Passed
7-Jun-2003    97 69 71%
6-Dec-2003 107 69 64%
23-May-2004 4 4 100%
5-Jun-2004 133 102 77%
4-Dec-2004 139 104 75%
4-Jun-2005 152 116 76%
4-Dec-2005 159 88 55%
4-Jun-2006 122 88 72%
Totals 913 640 70%

Note – Since June 2006 the exam is available in Spanish.

 

Century Labs II Corporation Has New Location

Century Labs II Corporation in Ft. Wayne, Indiana has moved to a new location within the Ft. Wayne area. Century Labs is committed to total quality management and has been serving DOD contractors, major aerospace manufacturers, and other manufacturing industries since 1982. Most of Century labs’ metrologists have been professionally trained by the military, keeping pace with advances in technology through professional associations and factory training. Century Labs provides a full range of calibration services on-site in addition to calibration at their new facilities in Fort Wayne. Visit www.clc2.com for more company details.

Old Address:
Century Labs II Corporation
2802-G Congressional Pkwy.
Fort Wayne, IN 46808
Ph: 260-471-1673
Fax: 260-471-0501

New Address:
3120 Independence Dr
Fort Wayne, IN 46808
Ph: 260-471-1673
Fax: 260-471-0501


ISA EXPO 2006 Proves a Hit for Attendees and Exhibitors

ISA EXPO 2006 wrapped up on Thursday, 19 October in Houston, Texas. The three day event, held at the Reliant Center, featured a cutting-edge technical conference, a renowned training program, and an exhibition featuring some of the newest technology on the market today.

Nearly 13,000 attendees had the opportunity to hear impressive keynote addresses from international experts, attend over 70 conference sessions, and see the latest developments from over 550 exhibitors on the show floor.

Exhibitors were impressed with the types of attendees that they met at this year's event. "We've had so many qualified leads this week. Every day, we had a captive audience, and that's been really great," said Laureen Lashyn, BW Technologies' supervisor of tradeshows and advertising.

"There's so much excitement on the show floor this year. All of these new types of technology - like wireless and programmable automation controllers - are really motivating attendees to learn more while they're visiting exhibitors," added Robert Jackson, National Instruments Product Marketing Manager.

Continue reading the entire article at www.isa.org.

 

2006 William A. Wildhack Award Winner

John Wehrmeyer, retired since 2001 from a 20-year career at Kodak Research Labs in Rochester, NY, has received the 2006 William Wildhack Award from NCSL International. It is presented annually to recognize outstanding contributions to the field of metrology and measurement science, consistent with the goals of NCSLI. The award was presented August 7, 2006 at the organization's annual Workshop and Symposium in Nashville, TN, by Past President Harry Moody, who chaired the selection committee.

Wehrmeyer's award was based on his more than 20 years of service to NCSLI in its management ranks, his contributions to the technical successes of NCSLI, his tireless work chairing multiple committees involved in the Z540 activities. He was an NCSLI Vice President, presented papers and was involved in many aspects of our annual conferences.

John Wehrmeyer has been an active supporter of NCSLI for over twenty (20) years. There are several activities John was involved in that are noteworthy of mention. First of all, John was very active in the initial version of the ANSI/NCSL Z540-1-1994 standard. He then was co-chair for the committee that developed the "Handbook for the Interpretation and Application of ANSI/NCSL Z540-1-1994." The latter took 2 years of dedicated effort to put together.

Read more about John Wehrmeyer and the Wildhack Award at http://www.ncsli.org/awards/wildhack2006.cfm.

 

Hexagon Metrology Opens Precision Center in Huntersville, North Carolina

Hexagon Metrology Inc. announced it has moved one of its U.S. Hexagon Precision Centers to a new expanded facility at 13245 Reese Blvd. West in Huntersville, NC. This field office was originally established in 1985 in Charlotte, NC, by the former Brown and Sharpe company. The move was prompted by the growing demand for Hexagon's industrial measurement products and the need for a highly accessible regional location for Hexagon's customers. Hexagon Metrology is the world’s largest manufacturer of precision dimensional measurement equipment and software. Hexagon's extensive name-brand portfolio of quality assurance products includes Brown & Sharpe, Leica Geosystems, ROMER, Sheffield, PC-DMIS, DEA, Leitz, and TESA.

The new 10,000-sq. ft. Precision Center features a large training facility, a state-of-the-art demonstration center, and a new precision measurement laboratory. The expanded training center doubles Hexagon's capacity to hold all levels of customer training courses and workshops. The addition of a precision measurement laboratory enables Hexagon to offer contract inspection services to manufacturers in the region. The Hexagon Metrology group at this location provides sales and customer support for Brown & Sharpe CMMs (Coordinate Measuring Machines), Romer Articulated Arms and Leica Geosystems Laser trackers. This office services more than 1,000 Brown and Sharpe CMMs in North Carolina, South Carolina, and Virginia.

To learn more visit http://hexagonmetrology.us/content/view/29/20/.

 

NACLA’s 2007 Forum

The National Cooperation for Laboratory Accreditation (NACLA) will hold its annual Forum-Annual General Meeting (AGM) on March 20 and 21, 2007, at the Sheraton Columbia Hotel, in Columbia, MD. Meeting theme is “Market/Specifier Driven Accreditation in the U.S.”

NACLA members and all individuals in the various stakeholder groups that NACLA serves are encouraged to attend this conference. All these groups will find value in the conference: industry, government, testing and calibration laboratories and accreditation bodies.

The Forum Program is now being developed. A major subject will be NACLA’s implementation of its restructured recognition program, a program which allows NACLA to serve its U.S. industry and government clients and specifiers more effectively and, at the same time, to continue assisting those U.S. accreditation bodies that desire international acceptance by way of the ILAC mutual recognition arrangement (MRA).

Other topics that will be addressed include: Problem Areas in Measurement Uncertainty; Ethical Issues for Laboratories and Accreditation Bodies; and Controlling the Use of an Accreditation Body’s Logo. During the AGM portion of the event, NACLA officials will discuss NACLA’s progress in the past year and its plans for 2007. Attendees will have ample opportunity to ask questions of and offer suggestions to the NACLA leaders.

The Preliminary Program and Registration Form for the 2007 Forum-AGM will be available in December 2006. For more information visit NACLA at www.nacla.net.

New NVLAP Certificate of Accreditation

In October 2006, NVLAP began using a new version of the Certificate of Accreditation to ISO/IEC 17025:2005, General requirements for the competence of testing and calibration laboratories. The certificate now includes the following statement to convey that an accredited laboratory’s management system meets the principles of ISO 9001:2000.

"This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer joint ISO-ILAC-IAF Communique dated 18 June 2005)"

NVLAP-accredited laboratories may use the above statement on their test reports and calibration certificates if they supply, or provide access to via a website, the Joint ISO-ILAC-IAF Communique as part of the package for their laboratory customers.

The Joint ISO-ILAC-IAF Communique was issued to counter a perception that accredited laboratories do not operate a recognized quality management system. Many accredited laboratories have had difficulty convincing their customers that they should be asking laboratories to be accredited to ISO/IEC 17025 rather than be certified (or registered) to ISO 9001. The situation became more acute with the publication of ISO 9001:2000, as some customers continually asked laboratories to be certified, when they really meant accredited. It is anticipated that the use of the above statement by both accreditation bodies and accredited laboratories will help to address the market issues caused by the confusion between these two terms.

For more information visit NVLAP’s website at http://ts.nist.gov/Standards/214.cfm.

 

NIST Tutorials Planned For MSC 2007 Conference

Learn about the NIST tutorials planned for the upcoming 2007 Measurement Science Conference. The 2007 MSC will host three NIST Seminars.
All Seminars are two full days and will begin on Monday, January 22, 2007 and end on Tuesday, January 23, 2007.

  • Pressure and Vacuum Measurement
  • Fluid Flow Measurement
  • Hands-on Workshop on Estimating and Reporting Measurement Uncertainty

The Measurement Science Conference was founded in 1970 to promote education and professionalism in measurement science and related disciplines. The Conference has grown and matured to meet the needs of dynamic measurement technologies as well as to address pertinent national and global measurement issues. Based in California, the MSC has attracted experts from around the world as speakers, exhibitors and attendees.

The theme for the January 2007 conference is Apply Metrology – Rule the World.
Visit MSC’s website at http://www.msc-conf.com/msc/nist.html for more details.

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