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Fluke’s
Precision Measurement Seminar Series
The
FPM Seminar Series is a series of free seminars on topics of interest
to calibration professionals. Upcoming seminars this month:
The
Reference Multimeter and Ratio Measurements
Voltage ratio measurements are critical to electrical metrology. Standards
labs have long used the Kelvin Varley Divider to make precise voltage
comparisons over a wide range of ratio values. This session discusses
how a reference multimeter with ratio measurement capabilities can be
an economical and easy-to-use alternative for Kelvin-Varley dividers.
Included
in the seminar is a comparison of differing voltages at approximately
a 10:1 ratio with techniques using both a Kelvin-Varley Divider and a
ratio-capable dmm. A comparison summary of the ratio capabilities of Fluke's
8508A Reference Multimeter, 720A Kelvin-Varley Divider and 752A Reference
Divider Measurement uncertainty and error budgets will be studied for
the various example applications.
Wednesday,
April 25
9:00 a.m. Pacific Time
1 hour duration
Register
for this session
Applying
Measurement Uncertainty to Digital Multimeter Calibration
This seminar is an introductory study of measurement uncertainty and its
application to digital multimeter calibration. It studies measurement
uncertainty from the perspective of the formally documented Guides to
Uncertainty in Measurement (GUMs). Both general and detailed examples
are provided. Fluke's MET/CAL software is introduced as a tool to assist
in calculating measurement uncertainty during calibrations. Finally a
list of different references are cited to assist in further study of the
topic
Thursday,
April 26
8:00 a.m. Pacific Time
1 hour, 30 minutes duration
Register
for this session
Precision
RF Sourcing -- How to Cut RF Calibration Time in Half for Spectrum Analyzers
and RF Measurement Instrumentation
This seminar examines RF calibration & measurement methodology. It
focuses on applications of calibrating complex instrumentation such as
spectrum analyzers and other RF measurement devices. The existing compromises
that require extensive signal level characterization to obtain the necessary
high accuracy of signal sourcing are studied (often resulting in multi
hundreds of separate measurements). Then the benefits of using a new precision
source are shown, eliminating the need for characterization, and simplifying
the calibration process in both manual and automated methods. Finally
real time saving of up to and exceeding 75% are shown to be readily achievable.
Tuesday,
April 24
10:00 a.m. Pacific Time
1 hour duration
Register
for this session
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