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Fluke’s Precision Measurement Seminar Series

The FPM Seminar Series is a series of free seminars on topics of interest to calibration professionals. Upcoming seminars this month:

The Reference Multimeter and Ratio Measurements
Voltage ratio measurements are critical to electrical metrology. Standards labs have long used the Kelvin Varley Divider to make precise voltage comparisons over a wide range of ratio values. This session discusses how a reference multimeter with ratio measurement capabilities can be an economical and easy-to-use alternative for Kelvin-Varley dividers.

Included in the seminar is a comparison of differing voltages at approximately a 10:1 ratio with techniques using both a Kelvin-Varley Divider and a ratio-capable dmm. A comparison summary of the ratio capabilities of Fluke's 8508A Reference Multimeter, 720A Kelvin-Varley Divider and 752A Reference Divider Measurement uncertainty and error budgets will be studied for the various example applications.

Wednesday, April 25
9:00 a.m. Pacific Time
1 hour duration
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Applying Measurement Uncertainty to Digital Multimeter Calibration
This seminar is an introductory study of measurement uncertainty and its application to digital multimeter calibration. It studies measurement uncertainty from the perspective of the formally documented Guides to Uncertainty in Measurement (GUMs). Both general and detailed examples are provided. Fluke's MET/CAL software is introduced as a tool to assist in calculating measurement uncertainty during calibrations. Finally a list of different references are cited to assist in further study of the topic

Thursday, April 26
8:00 a.m. Pacific Time
1 hour, 30 minutes duration
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Precision RF Sourcing -- How to Cut RF Calibration Time in Half for Spectrum Analyzers and RF Measurement Instrumentation
This seminar examines RF calibration & measurement methodology. It focuses on applications of calibrating complex instrumentation such as spectrum analyzers and other RF measurement devices. The existing compromises that require extensive signal level characterization to obtain the necessary high accuracy of signal sourcing are studied (often resulting in multi hundreds of separate measurements). Then the benefits of using a new precision source are shown, eliminating the need for characterization, and simplifying the calibration process in both manual and automated methods. Finally real time saving of up to and exceeding 75% are shown to be readily achievable.

Tuesday, April 24
10:00 a.m. Pacific Time
1 hour duration
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